Execution and Setup Information =

DUT = Comment:

General Comment - = USB3.2 DUT

UI-Unit Interval

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
UI-Unit Interval	Lane0	Long	Gen1	SigTest	200.491 ps	Pass	551.073 fs & 568.927 fs	199.94 ps	201.06 ps

Comments

USB 3.2 Specification, = Rev 1.0, Table 6-17

Rj-Tx random jitter-Dual = Dirac

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
Rj-Tx random jitter-Dual Dirac	Lane0	Long	Gen1	SigTest	1.089 ps	Informative	1.089 ps & 2.181 ps	0 s	3.27 ps

Comments

USB 3.2 Specification, = Rev 1.0, Table 6-19

Mask Hits

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
Mask Hits	Lane0	Long	Gen1	SigTest	0.000	Pass	0.000	N.A	0

Comments

USB 3.2 Specification, = Rev 1.0, Table 6-18

TSSC-Freq-Dev-Max

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
TSSC-Freq-Dev-Max (Max)	Lane0	Long	Gen1	SigTest	-4.904 kppm (Max)	Pass	396.020 ppm & 1.204 kppm	-5.3 kppm	-3.7 kppm
TSSC-Freq-Dev-Max (Min)	Lane0	Long	Gen1	SigTest	-4.915 kppm (Min)	Pass	384.509 ppm & 1.215 kppm	-5.3 kppm	-3.7 kppm

Comments

USB 3.2 Specification, = Rev 1.0, Table 6-16

TSSC-Freq-Dev-Min

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
TSSC-Freq-Dev-Min (Max)	Lane0	Long	Gen1	SigTest	124.324 ppm (Max)	Pass	424.324 ppm & 175.676 ppm	-300.0 ppm	300.0 ppm
TSSC-Freq-Dev-Min (Min)	Lane0	Long	Gen1	SigTest	111.640 ppm (Min)	Pass	411.640 ppm & 188.360 ppm	-300.0 ppm	300.0 ppm

Comments

USB 3.2 Specification, = Rev 1.0, Table 6-16

TSSC-Mod-Rate - SSC Modulation = rate

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
TSSC-Mod-Rate = - SSC Modulation rate	Lane0	Long	Gen1	SigTest	31.516 kHz	Pass	1.516 kHz & 1.484 kHz	30.0 kHz	33.0 kHz

Comments

USB 3.2 Specification, = Rev 1.0, Table 6-16

DJ-Tx deterministic Jitter-Dual = Dirac

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
DJ-Tx deterministic Jitter-Dual Dirac	Lane0	Long	Gen1	SigTest	27.505 ps	Pass	27.505 ps & 58.495 ps	0 s	86.0 ps

Comments

USB 3.2 Specification, = Rev 1.0, Table 6-19

TJ-Tx total jitter-Dual Dirac at = 1E-12 BER

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
TJ-Tx total jitter-Dual Dirac at 1E-12 BER	Lane0	Long	Gen1	SigTest	42.812 ps	Pass	42.812 ps & 89.188 ps	0 s	132.0 ps

Comments

USB 3.2 Specification, = Rev 1.0, Table 6-19

Eye Height - Transmitter Eye = Mask

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
Eye Height - Transmitter Eye Mask	Lane0	Long	Gen1	SigTest	231.914 mV	Pass	131.914 mV & 968.086 mV	100.0 mV	1.2 V

Comments

USB 3.2 Specification, = Rev 1.0, Table 6-19

Eye Width @ 1E-12 BER

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
Width@BER	Lane0	Long	Gen1	SigTest	157.188 ps	Pass	89.188 ps	68.0 ps	N.A

Comments

USB 3.2 Specification, = Rev 1.0, Table 6-18

LFPS Duty Cycle

Measurement Details	Lane	Channel	Generation	Method	Measured Value	Test Result	Margin	Low Limit	High Limit
LFPS Duty Cycle (Max)	Lane0	Long	Gen1	SigTest	50.020 % (Max)	Pass	10.020 % & 9.980 %	40.0 %	60.0 %
LFPS Duty Cycle (Min)	Lane0	Long	Gen1	SigTest	49.982 % (Min)	Pass	9.982 % & 10.018 %	40.0 %	60.0 %

Comments